首页 > 最新目录 > 正文

05.靶基距对Mg掺杂TiO2薄膜的厚度及结构的影响

日期:2016-05-09 15:59:56 点击:

赵倩1,2,林启民1,2,谢程超2,杨越2

(1 内蒙古自治区白云鄂博矿多金属资源综合利用重点实验室,内蒙古包头 014010  

2 内蒙古科技大学数理与生物工程学院,内蒙古包头  014010)

关键词: TiO2薄膜磁控溅射靶基距

中图分类号:O469O552.5文献识别码:A

摘要:采用射频磁控溅射法制备衬底温度为750的不同靶基距的Mg掺杂TiO2薄膜。利用台阶仪、X-射线衍射仪分别研究了薄膜的厚度及物相。实验结果表明:随着靶基距的减小,薄膜的厚度增加,而对于纯的TiO2主峰的衍射峰强度增加;除了靶基距为4cm的薄膜中有锐钛矿结构的MgTi2O5杂相之外,其它靶基距的薄膜均为TiO2的锐钛矿与金红石的混合相;在靶基距为6cm时锐钛矿相TiO2的晶粒尺寸最大,大小为34nm;在靶基距为7cm时金红石相TiO2的晶粒尺寸最大,大小为11.5nm

Theeffect of different target-substrate distance on the thickness and structure ofMg-doped TiO2 thin film

Qian Zhao1,2, Qi-minLin1,2, Cheng-chao Xie2, Yue Yang2

(1 Key Laboratoryof Integrated Exploitation of Bayan Obo Multi-Metal Resources, InnerMongolia University of Science and TechnologyBaotou 014010China;

2Mathematics,Physics and Biological Engineering School, Baotou 014010, China)

Keywords:Thethin film of TiO2  ; Magnetron sputtering; Target-substratedistance

AbstractMg-doped TiO2 films withdifferent target-substrate distance were prepared by RF-magnetron sputtering at750 substrate temperature. The thickness andphase of the films were studied by using the step tester and X-ray diffraction,respectively. The experimental results show that the thickness and theintensity of diffraction peak from pure TiO2 of the film increasewith the decrease of target-substrate distance. All samples are mixed phase ofanatase and rutile TiO2 except that the film prepared under the 4cm of target-substrate distance has the second phase of anatase MgTi2O5. The grain size of anatase phase of TiO2 prepared under the 6 cm of target-substrate distance is 34 nm ,which isthe biggest in all anatase phase of the prepared TiO2; and the grainsize of rutile phase of TiO2 under the 7cm of target-substrate distance is 11.5 nm ,which is thebiggest in all rutile phase of the prepared TiO2.

地址:内蒙古包头市昆都仑区阿尔丁大街7号 邮编:014010 电话:0472-5951610或0472-5953910 Email:cky@imust.edu.cn nkdxb@imust.edu.cn

版权所有:内蒙古科技大学学报编辑部(©2013)